Elliott one of three IEC Young Professionals winners

Stephen Elliott, an associate professor in the Department of Technology Leadership & Innovation, is being honored this week by the International Electrotechnical Commission (IEC) at the 75th IEC General Meeting in Melbourne, Australia. Elliott is one of three U.S. winners of the IEC Young Professionals Workshop competition. The program seeks to cultivate long-term national involvement in the international arena, strengthen the future of technology transfer, and encourage the participation of young professionals in shaping standardization and conformance. Elliott is the head of Purdue’s Biometric Standards Performance and Assurance (BSPA) laboratory. Since 2001, when he joined the International Committee for Information Technology Standards (INCITS) M1 - Biometrics, he has been committed to educating students on the standards process and the importance and necessity of the work done by standards organizations such as the IEC, the International Organization for Standardization (ISO), ANSI, and INCITS by incorporating standards development and strategy into the university’s curriculum. He is a member of the ANSI Committee on Education, serves as project editor for several ISO/IEC Joint Technical Committee (JTC) 1 Subcommittee (SC) 37 standards on biometrics, and serves as editor for the ISO/IEC JTC 1 Supplement to the ISO/IEC Directives.